Strobe signal generation circuit and semiconductor apparatus using the same

ABSTRACT

A strobe signal generation circuit may include: a counter to generate a first source signal and a second source signal by counting an external strobe signal; a delay to generate a first delayed signal and a second delayed signal by delaying the first source signal and the second source signal by a preset time; and a combination unit to generate internal strobe signals by selectively combining the first source signal, the second source signal, the first delayed signal, and the second delayed signal.

CROSS-REFERENCES TO RELATED APPLICATION

The present application claims priority under 35 U.S.C. §119(a) toKorean application number 10-2014-0186109, filed on Dec. 22, 2014, inthe Korean Intellectual Property Office, which is incorporated herein byreference in its entirety.

BACKGROUND

1. Technical Field

Various embodiments relate to a semiconductor circuit, and moreparticularly, to a strobe signal generation circuit and a semiconductorapparatus using the same.

2. Related Art

A semiconductor apparatus may receive data and a strobe signal fromoutside during a write operation, the strobe signal indicating a datainput timing.

The semiconductor apparatus, for example, a DDR (Double Data Rate)semiconductor memory may be configured to internally operate in an SDR(Single Data Rate) manner, as the operating speed of the semiconductormemory, that is, the frequency of a clock signal provided from outsideincreases.

In order for the semiconductor apparatus to operate in the SDR manner,the semiconductor apparatus must internally process the strobe signalprovided from outside, and generate an internal strobe signal, that is,a strobe signal divided into even/odd strobe signals.

SUMMARY

In an embodiment of the invention, a strobe signal generation circuitmay include a counter to generate a first source signal and a secondsource signal by counting an external strobe signal. The strobe signalgeneration circuit may also include a delay to to generate a firstdelayed signal and a second delayed signal by delaying the first sourcesignal and the second source signal by a preset time. In addition, thestrobe signal generation circuit may include a combination unit togenerate internal strobe signals by selectively combining the firstsource signal, the second source signal, the first delayed signal, andthe second delayed signal.

In an embodiment of the invention, a semiconductor apparatus may includea memory block to store data or output stored data according to acontrol signal. The semiconductor apparatus may also include a pad unitincluding a plurality of pads. Further, the semiconductor apparatus mayinclude a strobe signal generation circuit to generate internal strobesignals by delaying and selectively combining a first source signal anda second source signal generated by counting an external strobe signalinputted through the pad unit. In addition, the semiconductor apparatusmay include a control unit to generate the control signal for writingdata, inputted through the pad unit from outside in a DDR manner, to thememory block in an SDR manner according to the internal strobe signalsduring a write operation.

In an embodiment of the invention, a strobe signal generation circuitmay include a counter to generate a first source signal by counting arise edge of a strobe signal and a second source signal by inverting thefirst source signal. The strobe signal generation circuit may alsoinclude a delay to delay the first source signal and the second sourcesignal by a preset time. Further, the to strobe signal generationcircuit may include a combination unit to generate an even strobe signaland an odd strobe signal according to the first source signal, thesecond source signal, a first delayed signal, and a second delayedsignal.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram illustrating the configuration of a semiconductorapparatus 100 according to an embodiment of the invention;

FIG. 2 is a diagram illustrating the configuration of a strobe signalgeneration circuit 101 of FIG. 1;

FIG. 3 is an operation waveform diagram of the strobe signal generationcircuit 101 of FIG. 2;

FIG. 4 is a strobe signal waveform diagram during an SDR mode operationof the semiconductor apparatus 100 according to an embodiment of theinvention; and

FIG. 5 illustrates a block diagram of a system employing a memorycontroller circuit in accordance with an embodiment of the invention.

DETAILED DESCRIPTION

Hereinafter, a strobe signal generation circuit and a semiconductorapparatus using the same according to the invention will be describedbelow with reference to the accompanying figures through variousembodiments. Various embodiments are directed to a to strobe signalgeneration circuit of a semiconductor apparatus, which is capable ofstably generating a strobe signal regardless of an environment in whichan external strobe signal is provided.

With the increase in operating speed of a semiconductor apparatus 100according to an embodiment of the invention, or, the increase infrequency of a clock signal provided from outside, the semiconductorapparatus 100 may be internally operated in the SDR manner to secure atiming margin for a stable operation.

The semiconductor apparatus 100 according to an embodiment of theinvention may be configured to process data in the SDR manner, until thedata are outputted to the outside of the semiconductor apparatus 100after the data are inputted to the semiconductor apparatus 100.

More specifically, outside the semiconductor apparatus 100, a dataread/write operation may be performed in the DDR manner. Furthermore,inside the semiconductor apparatus 100, read data and write data may beprocessed in the SDR manner.

Referring to FIG. 1, the semiconductor apparatus 100 according to anembodiment of the invention may include a strobe signal generationcircuit 101, a control unit 102, a memory block 103, and a pad unit 104.

The memory block 103 may store data or output stored data in response toa control signal CTRL.

The memory block 103 may include a plurality of unit memory blocks, forexample, a plurality of memory banks.

The pad unit 104 may include a plurality of pads, and differentialstrobe signals DQS/DQSB, a command/address CMD/ADD. Further, data DQ maybe inputted through the plurality of pads.

During a write operation, differential strobe signals DQS/DQSB, acommand/address CMD/ADD, and data DQ, outputted is from a memorycontroller such as a CPU or GPU outside the semiconductor apparatus maybe provided to the semiconductor apparatus 100 through the pad unit 104.

The differential strobe signals DQS/DQSB may be provided to indicate aninput timing of the data DQ provided from outside together with thedifferential strobe signals DQS/DQSB during the write operation.

The strobe signal generation circuit 101 delay and selectively combinefirst and second source signals generated by counting an external strobesignal inputted through the pad unit 104 and generate an internal strobesignal.

The external strobe signal may include any one of the differentialstrobe signals DQS/DQSB.

The internal strobe signal may include an even strobe signal DQS_EV andan odd strobe signal DQS_OD.

The first and second source signals will be described with reference tothe following figures.

The control unit 102 may generate a control signal CTRL for writing dataDQ, inputted from outside in the DDR manner, to the memory block 103 inthe SDR manner according to the even strobe signal DQS_EV and the oddstrobe signal DQS_OD during a write operation.

The control unit 102 may generate the control signal CTRL for outputtingdata stored in the memory block 103 to the outside of the semiconductorapparatus 100 in the DDR manner during a read is operation.

Referring to FIG. 2, the strobe signal generation circuit 101 mayinclude a counter 200, a delay 300, and a combination unit 400.

The counter 200 may generate the first and second source signals Q0 andQ1 by counting an external strobe signal, or, one of the differentialstrobe signals DQS/DQSB, for example, the strobe signal DQSB.

The counter 200 may generate the first source signal Q0 by counting arising edge of the strobe signal DQSB. Further, the counter 200 maygenerate the second source signal Q1 by inverting the first sourcesignal Q0.

The delay 300 may generate first and second delayed signals Q0D and Q1Dby delaying the first and second source signals Q0 and Q1 by a presettime.

The combination unit 400 may selectively combine the first source signalQ0, the second source signal Q1, the first delayed signal Q0D, and thesecond delayed signal Q1D, and generate internal strobe signals, or, theeven strobe signal DQS_EV and the odd strobe signal DQS_OD.

The combination unit 400 may cross and combine the first source signalQ0 and the second source signal Q1 with the first delayed signal Q0D andthe second delayed signal Q1D. Further, the combination unit 400 maygenerate the internal strobe signals, that is, the even strobe signalDQS_EV and the odd strobe signal DQS_OD.

The combination unit 400 may generate the even strobe signal DQS_EV bycombining the first source signal Q0 and the second delayed signal Q1D.In addition, the combination unit 400 may generate the odd strobe signalDQS_OD by combining the second source signal Q1 and the first delayedsignal Q0D.

The combination unit 400 may include a first logic gate 401 and a secondlogic gate 402.

The first logic gate 401 may generate the even strobe signal DQS_EV byperforming an AND operation on the first source signal Q0 and the seconddelayed signal Q1D.

The second logic gate 402 may generate the odd strobe signal DQS_OD byperforming an AND operation on the second source signal Q1 and the firstdelayed signal Q0D.

Referring to FIG. 3, the operation of the strobe signal generationcircuit 101 will be described.

The first source signal Q0 and the second source signal Q1 may begenerated according to the strobe signal DQSB of the differential strobesignals DQS/DQSB.

The first source signal Q0 and the second source signal Q1 may bedelayed through the delay 300 to generate the first delayed signal Q0Dand the second delayed signal Q1D.

The generation timings of rising and falling edges of the first andsecond delayed signals Q0D and Q1D may differ according to a delay timeset in the delay 300.

The result obtained by performing an AND operation on the first sourcesignal Q0 and the second delayed signal Q1D may be generated as the evenstrobe signal DQS_EV. In addition, the result obtained by performing anAND operation on the second source signal Q1 and the first delayedsignal Q0D may be generated as the odd strobe signal DQS_OD.

Referring to FIG. 4, the SDR mode operation of the semiconductorapparatus 100 according to an embodiment of the invention will bedescribed as follows.

The data DQ and the differential strobe signals DQS/DQSB may be inputtedto the semiconductor apparatus 100 through the pad unit 104 fromoutside.

The data DQ may be inputted to the semiconductor apparatus 100 in theDDR manner at a timing corresponding to the differential strobe signalsDQS/DQSB.

The data DQ inputted through the pad unit 104, or, the data A to D maybe arranged as even data DQ_EV, that is, the data A and C and odd dataDQ_OD, that is, the data B and D, etc.

The pre-ambles or post-ambles of the differential strobe signal DQS/DQSBmay be omitted when the data are inputted according to successive writecommands.

In FIG. 4, the pre-ambles may be normally inputted, but the post-amblesmay be omitted.

When the even strobe signal DQS_EV and the odd strobe signal DQS_OD aregenerated by dividing any one of the differential strobe signalsDQS/DQSB, a falling edge of the odd strobe signal DQS_OD may not begenerated.

In an embodiment of the invention, however, the first source signal Q0and the second source signal Q1 may be generated by counting andinverting a rising edge of the strobe signal DQSB. Further, the firstdelayed signal Q0D and the second delayed signal Q1D obtained bydelaying the first source signal Q0 and the second source signal Q1, maybe crossed and combined with the first source signal Q0 and the secondsource signal Q1. As a result, it is possible to generate the evenstrobe signal DQS_EV and the odd strobe signal DQS_OD which have anormal waveform regardless of whether the post-ambles exist.

The even data DQ_EV, that is, the data A and C and the odd data DQ_OD,that is, the data B and D may be written to the semiconductor apparatusin the SDR manner according to the even strobe signal DQS_EV and the oddstrobe signal DQS_OD.

Referring to FIG. 5 a system 1000 may include one or more processors1100. The processor 1100 may be used individually or in combination withother processors. A chipset 1150 may be electrically coupled to theprocessor 1100. The chipset 1150 is a communication pathway for signalsbetween the processor 1100 and other components of the system 1000.Other components may include a memory controller 1200, an input/output(“I/O”) bus 1250, and a disk drive controller 1300. Depending on theconfiguration of the system 1000, any one of a number of differentsignals may be transmitted through the chipset 1150.

The memory controller 1200 may be electrically coupled to is the chipset1150. The memory controller 1200 can receive a request provided from theprocessor 1100 through the chipset 1150. The memory controller 1200 maybe electrically coupled to one or more memory devices 1350. The memorydevices 1350 may include the semiconductor apparatus described above.

The chipset 1150 may also be electrically coupled to the I/O bus 1250.The I/O bus 1250 may serve as a communication pathway for signals fromthe chipset 1150 to I/O devices 1410, 1420 and 1430. The I/O devices1410, 1420 and 1430 may include a mouse 1410, a video display 1420, or akeyboard 1430. The I/O bus 1250 may employ any one of a number ofcommunications protocols to communicate with the I/O devices 1410, 1420and 1430.

The disk drive controller 1300 may also be electrically coupled to thechipset 1150. The disk drive controller 1300 may serve as thecommunication pathway between the chipset 1150 and one or more internaldisk drives 1450. The disk drive controller 1300 and the internal diskdrives 1450 may communicate with each other or with the chipset 1150using virtually any type of communication protocol, including all ofthose mentioned above with regard to the I/O bus 1250.

According to an embodiment of the invention, the strobe signalgeneration circuit may stably generate the internal strobe signalsregardless of the environment in which the external strobe signal isprovided, thereby improving the operating performance of thesemiconductor apparatus as a result.

While certain embodiments have been described above, it will beunderstood to those skilled in the art that the embodiments describedare by way of example only. Accordingly, the semiconductor apparatusdescribed should not be limited based on the described embodiments.Rather, the semiconductor apparatus described should only be limited inlight of the claims that follow when taken in conjunction with the abovedescription and accompanying figures.

What is claimed is:
 1. A strobe signal generation circuit comprising: acounter to generate a first source signal and a second source signal bycounting an external strobe signal; a delay to generate a first delayedsignal and a second delayed signal by delaying the first source signaland the second source signal by a preset time; and a combination unit togenerate internal strobe signals by selectively combining the firstsource signal, the second source signal, the first delayed signal, andthe second delayed signal.
 2. The strobe signal generation circuitaccording to claim 1, wherein the external strobe signal is provided toindicate an input is timing of data provided from outside thesemiconductor apparatus together with the external strobe signal duringa write operation.
 3. The strobe signal generation circuit according toclaim 1, wherein the external strobe signal comprises differentialstrobe signals, and the counter generates the first source signal andthe second source signal by counting any one of the differential strobesignals.
 4. The strobe signal generation circuit according to claim 1,wherein the combination unit generates an even strobe signal as one ofthe internal strobe signals by combining the first source signal and thesecond delayed signal, and generates an odd strobe signal as an other ofthe internal strobe signals by combining the second source signal andthe first delayed signal.
 5. A semiconductor apparatus comprising: amemory block to store data or output stored data according to a controlsignal; a pad unit comprising a plurality of pads; to a strobe signalgeneration circuit to generate internal strobe signals by delaying andselectively combining a first source signal and a second source signalgenerated by counting an external strobe signal inputted through the padunit; and a control unit to generate the control signal for writingdata, inputted through the pad unit from outside in a DDR (Double DataRate) manner, to the memory block in an SDR (Single Data Rate) manneraccording to the internal strobe signals during a write operation. 6.The semiconductor apparatus according to claim 5, wherein the externalstrobe signal is provided to indicate an input timing of data providedfrom outside the semiconductor apparatus together with the externalstrobe signal during the write operation.
 7. The semiconductor apparatusaccording to claim 5, wherein the external strobe signal comprises anyone of differential strobe signals inputted through the pad unit.
 8. Thesemiconductor apparatus according to claim 5, wherein the internalstrobe signals comprise an even strobe signal and an odd strobe signal.9. The semiconductor apparatus according to claim 5, wherein the strobesignal generation circuit comprises: a counter to generate a firstsource signal and a second source signal by counting the external strobesignal; a delay to generate a first delayed signal and a second delayedsignal by delaying the first source signal and the second source signalby a preset time; and a combination unit to generate the internal strobesignals by selectively combining the first source signal, the secondsource signal, the first delayed signal, and the second delayed signal.10. The semiconductor apparatus according to claim 9, wherein thecombination unit generates an even strobe signal as one of the internalstrobe signals by combining the first source signal and the seconddelayed signal, and generates an odd strobe signal as an other of theinternal strobe signals by combining the second source signal and thefirst delayed signal.
 11. The semiconductor apparatus according to claim5, wherein the control unit generates the control signal for outputtingdata stored in the memory block to the outside of the semiconductorapparatus in a DDR manner during a read operation.
 12. A strobe signalgeneration circuit comprising: a counter to generate a first sourcesignal by counting a rise edge of a strobe signal and a second sourcesignal by inverting the first source signal; to a delay to delay thefirst source signal and the second source signal by a preset time; and acombination unit to generate an even strobe signal and an odd strobesignal according to the first source signal, the second source signal, afirst delayed signal, and a second delayed signal.
 13. The strobe signalgeneration circuit according to claim 12, wherein the combination unitcombines the first source signal and the second source signal with thefirst delayed signal and the second delayed signal to generate the evenstrobe signal and the odd strobe signal.
 14. The strobe signalgeneration circuit according to claim 12, wherein the first sourcesignal and the second source signal are generated according to an otherstrobe signal of differential strobe signals.
 15. The strobe signalgeneration circuit according to claim 12, wherein the counter generatesthe first source signal and the second source signal by counting onedifferential strobe signal.
 16. The strobe signal generation circuitaccording to claim 14, wherein the differential strobe signals includean external strobe signal.
 17. The strobe signal generation circuitaccording to claim 12, wherein the even strobe signal and the odd strobesignal are internal strobe signals.
 18. The strobe signal generationcircuit according to claim 12, wherein differential strobe signals areprovided to indicate an input timing of data during a write operation.19. The strobe signal generation circuit according to claim 12, whereinthe first delayed signal and the second delayed signal are generated bydelaying the first source signal and the second source signal throughthe delay.
 20. The strobe signal generation circuit according to claim19, wherein a generation timing of a rising edge and a falling edge ofthe first delayed signal is different from a generation timing of arising edge and a falling edge of the second delayed signal.